Device Simulation of Carrier Life-Time Controlled GTO.

A Numerical Simulation of Hot-carrier Induced Device Degradation

For radical designs the hot-carrier reliability is an important issue. This creates the need for the numerical simulation of hot-carrier induced degradation. From a design point of view, the goal of the degradation simulation will be the hot-carrier aging simulation for the prediction of device lifetime. This simulation requires a complicated set of physical models, which includes the hot-carri...

a time-series analysis of the demand for life insurance in iran

با توجه به تجزیه و تحلیل داده ها ما دریافتیم که سطح درامد و تعداد نمایندگیها باتقاضای بیمه عمر رابطه مستقیم دارند و نرخ بهره و بار تکفل با تقاضای بیمه عمر رابطه عکس دارند

Simulation of the Admittance Control Based Haptic Interface Device

Real-time Simulation of a 48-Pulse GTO STATCOM Compensated Power System on PC-Based RT-LAB Simulator

-This paper reports on the real-time simulation of a 48-pulse GTO STATCOM static compensator with RT-LAB Electrical System Simulator using Linux PC-based, multiprocessor technology. The power system has 3 buses and 3 transmission lines and is modeled with SimPowerSystems blockset for Simulink and specialized GTO models that provide an effective method to handle the large number of switches in t...

Fast Iterative Solution of Carrier Continuity Equations for Three-Dimensional Device Simulation

In this paper the use of iterative methods for the solution of the carrier continuity equations in three-dimensional semiconductor device simulators is summarized. An overview of the derivation of the linear systems from the basic stationary semiconductor device equations is given and the algebraic properties of the nonsymmetric coefficient matrices are discussed. Results from the following cla...